K. Andre Mkhoyan                                                                               Personal webpage

PUBLICATION LIST

Scientific

  1. K.A. Mkhoyan, E.J. Kirkland, J. Silcox and E.S. Alldredge, Atomic-level characterization of GaN/AlN quantum wells, J. Appl. Phys. 96, 738 (2004).
  2. K.A. Mkhoyan, J. Silcox, Z. Yu, W.J. Schaff and L.F. Eastman, Formation of  the quasi-two-dimensional electron gas in GaN/AlGaN heterostructures with diffuse interfaces, J. Appl. Phys. 95, 1843 (2004).
  3. K.A. Mkhoyan, J. Silcox, H. Wu, W.J. Schaff and L.F. Eastman, Nonuniformities in GaN/AlN quantum wells, Appl. Phys. Lett. 83, 2668 (2003).
  4. K.A. Mkhoyan, J. Silcox, E.S. Alldredge, N.W. Ashcroft, H. Lu, W.J. Schaff and L.F. Eastman, Measuring electronic structure of wurtzite InN using electron energy loss spectroscopy, Appl. Phys. Lett. 82, 1407 (2003).
  5. K.A. Mkhoyan and J. Silcox, Electron-beam-induced damage in wurtzite InN, Appl. Phys. Lett. 82, 859 (2003).
  6. H. Wu, W.J. Schaff, G. Koley, M. Furis, A.N. Cartwright, K.A. Mkhoyan, J. Silcox, W. Henderson, W. A. Doolittle and A.V. Osinsky, Molecular Beam Epitaxial Growth of AlN/GaN Multiple Quantum Wells, MRS Proceeding, 743, L6.2.1 (2002).
  7. K.A. Mkhoyan, E.S. Alldredge, J. Silcox, N.W. Ashcroft, Determination of the width of the GaN/AlGaN heterointerface using EELS, Proceeding Microscopy and Microanalysis 2001, 7, p. 216.
  8. M.M. Mkrtchyan, A.S. Gasparyan, K.A. Mkhoyan, J.A. Liddle, and A.E. Novembre, Determination of the possible magnitude of the charging effect in a SCALPEL mask membrane, J. Vac. Sci. Technol. B 17(6), pp. 2888-2892 (1999).
  9. M.M. Mkrtchyan, A.S. Gasparyan, K.A. Mkhoyan, J. A. Liddle, A. E. Novembre, D. A. Muller, SCALPEL Mask-Membrane Charging, Microelectron. Eng. 46, 223 (1999).
  10. E.M. Kazaryan, K.A. Mkhoyan, H.A. Sarkisyan, Indirect Transitions in Thin Films Due to Coulomb Interaction Between Electrons, Thin Solid Films 338 (1-2), 185 (1999).
  11. E.M. Kazaryan, K.A. Mkhoyan, Indirect Electron Transitions in Semiconductors Occurring as a Result of Scattering of Charge Carriers by Dislocations in a Quantizing Magnetic Field, Semiconductor 32, 404 (1998).
  12. E.M. Kazaryan, K.A. Mkhoyan, H.A.Sarkisyan, Indirect Transitions Caused by Electron-Dislocation Interaction in Size-Quantized Semiconductor Films, Thin Solid Films 302 (1-2), 54 (1997).
  13. A.S. Gasparyan, E.M. Kazaryan, K.A. Mkhoyan, The Size Quantization of Charge Carriers in Semiconducting Microcrystals of Ellipsoidal Form, J. Contempr. Phys. 34, 56 (1998).
  14. K.A. Mkhoyan, H.A. Sarkisyan, Permittivity Function of Size-Quantized Semiconducting Films, Uch. Zapiski YGU 2, 39 (1996) (in Russia).
  15. A.A. Kirakosyan, K.A. Kumashyan, K.A. Mkhoyan, H.A. Sarkisyan, Light Absorption in Semiconductors, Containing Dislocations, in Indirect Interband Transitions, J. Contempr. Phys. 30, 14 (1995).



Non-Scientific

  1. K. A. Mkhoyan, Reflection of an Armenian Student. How it can be done: The Armenian National Scientific and Educational Fund, Armenian Reporter Int., Vol. XXXV, Jan. 4, p.7, 2003.

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